Cascade Microtech Wins Two Awards for Tesla On-Wafer Power Semiconductor Device Characterization System
January 14 2008 - 8:00AM
PR Newswire (US)
Tesla system recognized by industry-leading publications Electronic
Products and Test & Measurement World BEAVERTON, Ore., Jan. 14
/PRNewswire-FirstCall/ -- Cascade Microtech today announced it has
received the prestigious Product of the Year award from key
industry publication Electronic Products for its Tesla power
semiconductor device characterization system. Also in December, the
Tesla system received an honorable mention from Test &
Measurement World's Best in Test awards. The Tesla system is the
industry's only power device measurement system to provide a
complete on-wafer solution for over-temperature, low contact
resistance measurements of power semiconductors up to 60A and
3000V. "The Tesla power device measurement system has reduced costs
by eliminating the hassles of packaging devices before we
characterize them," said Edouard de Fresart, power device section
manager, SMARTMOS Technology Center, Freescale Semiconductor.
"Wafer level characterization saves a great deal of development
time." Tesla was introduced in May of 2007. It was judged by the
editors of Electronic Products and Test & Measurement World
against nominated products released in the past year for its
overall importance to the electronics industry at large. The Tesla
system is featured in the January 2008 issue of both publications.
"We are obsessed with solving our customers' toughest probing
challenges and Tesla is no exception," said Geoff Wild, CEO of
Cascade Microtech. "This product is a perfect example of the value
that Cascade Microtech brings to our customers. Quite simply, we
enable measurements to be done at the wafer-level, saving them
loads of development time and, in the end, making them more
competitive." About the Tesla Power Semiconductor Device
Characterization System The Tesla measurement system offers an
on-wafer probing solution for measurements of power semiconductors
up to 60A and 3000V over a temperature range of -55 C to +200 C.
Exclusive chuck technology provides handling for wafers as thin as
100 microns and enables on-wafer measurements for devices up to
75W. Tesla's high-current parametric probe minimizes thermal
runaway at the probe-to-wafer contact, while handling up to 10A of
current in continuous mode and up to 60A of current in pulsed mode.
A high-voltage parametric probe measures breakdown currents as low
as
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