Verigy Honored with 2009 Hot 100 Product Award for Design-for-Manufacturability Software Solution
January 19 2010 - 3:05PM
Business Wire
Verigy (NASDAQ:VRGY), a premier semiconductor test company, has
won EDN magazine’s 2009 Hot 100 Product award for its software
toolset comprising the Triage Fault Locator™ and YieldVision™
Analysis and Visualization Tools, which work together to form the
company’s Yield Learning Solution. Verigy is the only test
equipment manufacturer to win in the software category.
The Yield Learning Solution facilitates
design-for-manufacturability by providing the accuracy necessary in
product development labs as well as the high throughput necessary
for volume production. These performance characteristics are
critical for both launching new products and ongoing manufacturing
monitoring.
“To choose the 2009 lineup of the Hot 100, EDN’s editors
examined thousands of new products across 16 product categories,”
said Rick Nelson, EDN editor-in-chief. “Verigy’s Triage and
YieldVision yield-learning tools were among the outstanding product
introductions in our software category.”
Bridging design and test to enhance yield management, Verigy’s
Triage and YieldVision software tools capture failure data and
perform yield analysis. This enables design-centric analysis and
visualization on Verigy’s V93000 SOC (system-on-chip) test platform
by integrating on-tester, real-time capture and analysis of
electrical failures on complex SOC devices.
The V93000’s scalable architecture allows for complete
integration with the Yield Learning Solution. Triage software’s
proprietary algorithms enable efficient data processing while
YieldVision’s analysis and visualization capabilities reduce the
time required to diagnose any problems. By seamlessly linking
electrical testing with physical-layout data, these tools can
quickly localize the sources of physical defects.
“This new software solution addresses the market’s need to close
the loop between design, fabrication and test,” said Colin Ritchie,
vice president of marketing for DfX Solutions at Verigy. “By
providing this new means of efficiently identifying and fixing any
design-for-manufacturability problems, we’re helping our customers
to optimize their time to market and profitability.”
Whereas traditional approaches to yield diagnosis can require
many days to identify design problems and generate unwieldy
terabytes of data that must be reviewed and analyzed, Verigy’s
on-tester approach generates much more focused kilobytes of data
and delivers those results in just minutes. Results from Verigy
customers show as much as a four-week acceleration in time to
market, an increase in entitlement yield of up to 6 percent, and a
tenfold reduction in the number of wafers required to reach
entitlement yield.
About Verigy
Verigy provides advanced semiconductor test systems and
solutions used by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Verigy offers
scalable platforms for a wide range of system-on-chip (SOC) test
solutions, and memory test solutions for Flash, DRAM including
high-speed memories, as well as multi-chip packages (MCP). Verigy
also provides advanced analysis tools that accelerate design debug
and yield ramp processes. Additional information about Verigy can
be found at www.verigy.com.
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