Bruker Announces Dimension FastScan, the World’s Fastest High-Resolution Atomic Force Microscope
May 02 2011 - 6:00AM
Business Wire
Bruker today announced the innovative and unique Dimension
FastScanTM Atomic Force Microscope (AFM), which delivers
a significant breakthrough in improved imaging speed without
sacrificing nanoscale resolution. The Dimension FastScan
enables users to work hundreds of times faster than is possible
with other commercial AFM systems, delivering results in seconds or
minutes instead of hours or days. The FastScan system sets
the new gold standard for performance and productivity in
large-sample, atomic scale imaging across the scientific,
biological, semiconductor, data storage and energy research
markets.
Bruker Dimension FastScan - a
Breakthrough in AFM Technology (Photo: Business Wire)
Stimulated by the ever-increasing demand to observe and better
understand materials at the nanoscale, the newest member of the
world’s most widely utilized AFM platform features numerous
technological innovations to enable a perfect balance of fast scan
speeds, high image resolution and accuracy. Based upon the highly
successful Dimension Icon® AFM architecture, the
FastScan AFM is a tip-scanning system that provides
measurements on both large and small size samples in air or
fluids.
“Dimension FastScan realizes one of Bruker’s goals for
AFM technology, which is to enable our customers to be more
productive without losing resolution or flexibility. Achieving
highest quality images in such amazingly short times is a
breakthrough experience,” said Mark R. Munch, Ph.D., President of
the Bruker Nano Surfaces Division. He continued: “With over
thirty-eight patents fueling its breakthroughs, FastScan
provides researchers the unique ability to use atomic force
microscopy for new applications requiring higher scanning speeds
that previously just were not available on a research-grade
AFM.”
“Dimension FastScan represents our continued commitment
to the scientific community by providing access to nanoscale
information more efficiently,” added David V. Rossi, Vice President
and General Manager of Bruker’s AFM Business. “Our new
FastScan, in conjunction with other recent Bruker AFM
technological breakthroughs, such as ScanAsyst™ and
PeakForce QNM™, delivers significant improvements in
productivity as well as enabling techniques that provide new
quantitative information at the nanoscale, and that make AFMs
easier to use by academia and industry alike.”
About FastScan
The Dimension FastScan system utilizes a revolutionary
XYZ closed-loop head that scans at high-speed rates while
delivering extremely low drift and low noise to make AFM easier to
use and more productive for all users. These features combine to
drastically cut stabilization times, allowing the system to acquire
artifact-free data hundreds of times faster than is possible with
any other AFM on the market. A new fast scanner, a high-resolution
camera, as well as automated laser and detector alignment, and
integrated feedback alignment tools deliver faster probe
positioning and sample navigation, thus allowing users to more
easily locate features of interest. Finally, the software offers an
intuitive workflow, while default experiment modes distill advanced
AFM processes into preconfigured settings. Whether using the
Icon scanner with ultra-low noise and high accuracy to
render sub-nanometer resolution and
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