Bruker AXS Microanalysis Announces European Launch of Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash(R) Silico
August 31 2008 - 11:05PM
Business Wire
At the 14th European Microscopy Conference opening today, Bruker
AXS Microanalysis announced the European launch of several new
products and options for Scanning Electron Microscope (SEM) based
materials analysis. The innovative new QUANTAX CrystAlignTM system
for SEM-based crystallographic analysis via electron backscatter
diffraction (EBSD) consists of an ultra-fast EBSD detector and
powerful, yet easy-to-use EBSD analysis software that is seamlessly
integrated with Bruker�s EDS software, ESPRITTM. The combination of
EBSD with Energy Dispersive X-Ray Spectroscopy (EDS) offers more
comprehensive materials characterization capabilities in Scanning
Electron Microscopes for a broad range of applications on metals,
ceramics, and geological samples. Dr. Gert Nolze, EBSD Product
Manager at Bruker AXS Microanalysis, commented: �The new Bruker
CrystAlign EBSD system provides several innovative capabilities:
ultra-fast acquisition rates of up to 750 patterns per second with
the unique ability of scanning the sample at a constant frame rate
and storing the patterns as a string of images for subsequent
indexing and evaluation. This novel EBSD collection strategy allows
investigation of individual patterns and re-analysis of the crystal
orientation maps without repeated data acquisition.� Bruker AXS
Executive Vice President Thomas Schuelein stated: �Bruker has
reached an important milestone in its microanalysis strategy, aimed
at further extending the versatility and analytical power of its
product lines for the micro- and nanoanalysis markets. The novel
CrystAlign system supplements the capabilities of our QUANTAX EDS
system by providing powerful tools for EBSD data acquisition,
interpretation and display of results, while making the EBSD
technique more accessible to the general microanalysis and SEM
user.� Bruker AXS Microanalysis also presents the XFlash� 5000
series of liquid nitrogen free XFlash� silicon drift detectors
(SDD) for use with its QUANTAX microanalysis systems. These new
detectors boast even further improved energy resolutions down to
123 eV at Mn-K? and 100,000 cps input count rate. All detectors are
equipped with an optimized electron trap, which supports
interference-free x-ray detection, even at very low excitation
energies. The new XFlash� 5000 family makes QUANTAX the ideal EDS
X-ray system for nanoanalysis. In addition, Bruker�s new ESPRIT
Feature software package extends the capabilities of the QUANTAX
EDS analysis systems for advanced particle analysis applications.
ESPRIT Feature utilizes the speed of both the QUANTAX image
digitizer and the XFlash EDS detector for fast particle
identification and chemical classification. Among its powerful
image analysis functions are configurable feature detection, and a
convenient review function, as well as chart and report generation.
ESPRIT Feature allows automatic unattended analysis of large
samples or areas by preset methods for detection, classification
and result handling. Bruker scientists will be available for
discussions at the Bruker AXS Microanalysis booth, E5. ABOUT BRUKER
AXS: For more information about Bruker AXS and Bruker Corporation
(NASDAQ: BRKR), please visit www.bruker-axs.com and www.bruker.com.
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