Volume | 2,278,581 |
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News | - | ||||||
Day High | 194.50 | Low High |
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Day Low | 189.97 |
Share Name | Share Symbol | Market | Stock Type |
---|---|---|---|
Applied Materials Inc | AMAT | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Previous Close |
---|---|---|---|---|
190.30 | 189.97 | 194.50 | 189.46 |
Trades | Shares Traded | VWAP | Financial Volume | Average Volume | 52 Week Range |
---|---|---|---|---|---|
50,419 | 2,278,581 | US$ 192.13 | US$ 437,774,562 | - | 109.15 - 214.91 |
Last Trade | Type | Quantity | Price | Currency |
---|---|---|---|---|
13:18:54 | 1 | US$ 193.81 | USD |
Applied Materials (AMAT) Options Flow Summary
Applied Materials Inc Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
160.53B | 830.90M | - | 26.52B | 6.86B | 8.25 | 23.41 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
Applied Materials News
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Historical AMAT Price Data
Period † | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 206.34 | 210.42 | 186.86 | 195.25 | 5,991,162 | -12.55 | -6.08% |
1 Month | 209.79 | 214.46 | 186.86 | 203.51 | 4,749,205 | -16.00 | -7.63% |
3 Months | 167.15 | 214.91 | 160.96 | 196.43 | 6,102,146 | 26.64 | 15.94% |
6 Months | 133.20 | 214.91 | 129.23 | 173.37 | 5,939,470 | 60.59 | 45.49% |
1 Year | 113.45 | 214.91 | 109.15 | 155.39 | 5,847,493 | 80.34 | 70.82% |
3 Years | 133.49 | 214.91 | 71.12 | 129.91 | 7,000,217 | 60.30 | 45.17% |
5 Years | 43.80 | 214.91 | 36.56 | 101.52 | 7,531,209 | 149.99 | 342.44% |
Applied Materials Description
Applied Materials is the world's largest supplier of semiconductor manufacturing equipment, providing materials engineering solutions to help make nearly every chip in the world. The firm's systems are used in nearly every major process step with the exception of lithography. Key tools include those for chemical and physical vapor deposition, etching, chemical mechanical polishing, wafer- and reticle-inspection, critical dimension measurement, and defect-inspection scanning electron microscopes. |