Volume | 619,874 |
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News | - | ||||||
Day High | 550.23 | Low High |
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Day Low | 540.82 |
Share Name | Share Symbol | Market | Stock Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Previous Close |
---|---|---|---|---|
543.24 | 540.82 | 550.23 | 549.00 | 544.62 |
Trades | Shares Traded | VWAP | Financial Volume | Average Volume | 52 Week Range |
---|---|---|---|---|---|
22,664 | 619,874 | US$ 546.14 | US$ 338,538,253 | - | 355.88 - 562.84 |
Last Trade | Type | Quantity | Price | Currency |
---|---|---|---|---|
18:45:15 | 4 | US$ 549.31 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
74.63B | 135.93M | - | 10.5B | 3.39B | 24.92 | 22.03 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period † | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 552.47 | 562.00 | 536.765 | 546.93 | 1,069,233 | -3.47 | -0.63% |
1 Month | 494.19 | 562.84 | 493.60 | 536.29 | 973,511 | 54.81 | 11.09% |
3 Months | 495.01 | 562.84 | 440.15 | 489.69 | 980,380 | 53.99 | 10.91% |
6 Months | 445.80 | 562.84 | 437.21 | 483.83 | 981,612 | 103.20 | 23.15% |
1 Year | 395.70 | 562.84 | 355.88 | 435.93 | 1,068,157 | 153.30 | 38.74% |
3 Years | 254.46 | 562.84 | 250.20 | 365.54 | 1,250,674 | 294.54 | 115.75% |
5 Years | 100.46 | 562.84 | 80.65 | 271.53 | 1,326,395 | 448.54 | 446.49% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |